Publications
Haze generation effect by pellicle and packing box on photomask
A Study of Haze Generation as Thin Film Materials
Effects of Photo Resist Erosion in Development on Critical Dimension
Haze growth on reticles – what’s the RigHT thing to do?
Novel mask inspection flow using Sensitivity Control Layers
Rapid and precise monitor of reticle haze
Polarization-induced astigmatism caused by topographic masks
Case Study: The Impact of VSB Fracturing


Rapid and precise monitor of reticle haze


Reticle Haze results from the deposition of a chemical residue of a reaction that is initiated by Deep Ultra Violet (DUV) or higher frequency actinic radiation. Haze can form on the backside of the reticle, on the chrome side and on the pellicle itself.  The most commonly reported effect of haze is a gradual loss in transmission of the reticle that results in a need to increase the exposure-dose in order to maintain properly sized features. Since haze formation is non-uniform across the reticle, transmission loss results in an increase in the Across Chip Linewidth Variation (ACLV) that is accompanied by a corresponding reduction in the manufacturing process window2. Haze continues to grow as the reticle is exposed to additional low wavelength radiation through repeated use.


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Date: 2009-10-21
Download Article: Monitor of Reticle Haze