
Photronics' technology capabilities are always improving to meet new challenges. As the semiconductor industry pushes into extremely low k1 processing, and due to the drastic effects of high MEEF lithography, Photronics has incorporated a full complement of Subwavelength Reticle Solutions (SRS) to its standard chrome-on-glass (COG) masks whose feature sizes and optical proximity correction (OPC) geometries help squeeze every nanometer of critical dimension (CD) capability into the wafer lithographer's process. Production binary masks are presently available down to the 130nm node, with early development samples available at the 90nm node.
|